ES Components performs an in-house AQL Visual Inspection per MIL-STD-883, Method 2010 or MIL-STD-750, Methods 2072 and 2073 for all die received, against the manufacturers published die geometry. One of the benefits of this measure is that it would make it very difficult for a counterfeit die to get through this inspection. By nature, Microelectronic Die are much more difficult to counterfeit as compared to packaged devices. Signed records of these inspections are kept by lot and are fully traceable by shipment. All records are kept for a minimum of 7 years. To date, ES Components has kept all of our historical records.